±¸ºÐ ¹øÈ£ : 2280S-32-6, 2280S-60-3
ÁÖ¿ä Ư¡ ¹× ÀåÁ¡
• Monitor load currents from 100nA to 6A with high accuracy curve tracers, and I-V systems at a fraction of their cost |
• Measure voltage and current with 6¨ö-digit resolution | | | | |
• Capture dynamic load currents as short as 140¥ìs | | | | | |
• Output up to 192W of low noise, linear regulated power | | | | |
• Programmable rise and fall times eliminate voltage overshoot and undershoot transients | |
• Built-in graphing simplifies analyzing trends or displaying voltage or current waveforms | |
• High resolution TFT display and soft-key/icon-based user interface simplify power supply operation |
• Programmable output sequences reduce test times | | | | |
• Sink up to 0.45A to discharge voltage quickly | | | | | |
• Digital I/O for direct communication with other devices and instruments | | |
• GPIB, USB, and LAN interfaces | | | | | | |
• Built-in web page simplifies automated control/monitoring | | | | |
• Automate tests easily with KickStart start-up software |
The Series 2280S Precision Measurement, Low Noise, Programmable DC Power Supplies
are much more than just sources of clean power; they are also precision measurement
instruments.
They can source stable, low noise voltages as well as monitor load currents over a wide
dynamic range from amps to nanoamps. The Model 2280S-32-6 can output up to 32V at
up to 6A; the Model 2280S-60-3 can output up to 60V at up to 3.2A.
Both supplies use linear regulation to ensure low output noise and superior load current
measurement sensitivity. A high resolution color Thin Film Transistor (TFT) screen displays
a wide range of information on measurements.
Soft-key buttons and a navigation wheel combine with the TFT display to provide an easy-
to-navigate user interface that speeds instrument setup and operation. In addition, built-in
plotting functions allow monitoring trends such as drift. These supplies provide the
flexibility required for both benchtop and automated test system applications. For
example, they provide a list mode, triggers, and other speed optimization functions to
minimize test time in automated testing applications.